Study of Amorphous Silicon Film Using Ion Beam Sputtering

碩士 === 南台科技大學 === 光電工程系 === 98 === In recent years, due to the energy shortage and global warming lead the green energy issues become very important. The researches in Thin Film Solar Cells received a lot of attentions. To fabricate amorphous silicon thin film solar cells using plasma-enhanced chemi...

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Main Authors: Jin-Cheng Tsai, 蔡進成
Other Authors: Wen-Tuan Wu
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/58589176068318499965
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spelling ndltd-TW-098STUT81240182016-11-22T04:13:29Z http://ndltd.ncl.edu.tw/handle/58589176068318499965 Study of Amorphous Silicon Film Using Ion Beam Sputtering 以離子束濺鍍法製作非晶矽薄膜之研究 Jin-Cheng Tsai 蔡進成 碩士 南台科技大學 光電工程系 98 In recent years, due to the energy shortage and global warming lead the green energy issues become very important. The researches in Thin Film Solar Cells received a lot of attentions. To fabricate amorphous silicon thin film solar cells using plasma-enhanced chemical vapor deposition (PECVD) is the most popular method. The disadvantages of PECVD are the high facility cost and using the toxic processing gases such as silane (SiH4). Whereas there is no these disadvantages using ion beam sputter system to deposit silicon thin films. Hydrogenated amorphous silicon thin films have attracted many attentions due to have high mobility and less defect density than the amorphous silicon (a-Si) thin films. In this study, the hydrogenated amorphous silicon (a-Si:H) thin films were fabricated using ion beam sputter system of which the low sputter yield to reduce defect density and correctly control deposited thin films. Therefore, it is a appropriate tool to explore the properties of hydrogenated amorphous silicon (a-Si:H) thin films with the absorption coefficient of 105cm-1. (a-Si:H) thin films were fabricated using different process temperatures and the hydrogen gas flows. The characteristics of deposited film were measured by FTIR, Micro-Raman Spectrometer, UV/Visible spectrometers. The results showed absorptance of the film were reached 40~50% at wavelength of 400nm. The photo energy gap were varied from 1.7~2.0eV depending on the structure of films. The silicon films deposited by ion beam sputter revealed amorphous characters .When the substrate temperature was set at 350℃and hydrogen gas flow was set as 10sccm would favor the formation Si-H2 bond. The analyses of the electrical property show that the dark and photo induced current decreased with increased substrate temperature and hydrogen gas flows. Wen-Tuan Wu 吳文端 2010 學位論文 ; thesis 82 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 南台科技大學 === 光電工程系 === 98 === In recent years, due to the energy shortage and global warming lead the green energy issues become very important. The researches in Thin Film Solar Cells received a lot of attentions. To fabricate amorphous silicon thin film solar cells using plasma-enhanced chemical vapor deposition (PECVD) is the most popular method. The disadvantages of PECVD are the high facility cost and using the toxic processing gases such as silane (SiH4). Whereas there is no these disadvantages using ion beam sputter system to deposit silicon thin films. Hydrogenated amorphous silicon thin films have attracted many attentions due to have high mobility and less defect density than the amorphous silicon (a-Si) thin films. In this study, the hydrogenated amorphous silicon (a-Si:H) thin films were fabricated using ion beam sputter system of which the low sputter yield to reduce defect density and correctly control deposited thin films. Therefore, it is a appropriate tool to explore the properties of hydrogenated amorphous silicon (a-Si:H) thin films with the absorption coefficient of 105cm-1. (a-Si:H) thin films were fabricated using different process temperatures and the hydrogen gas flows. The characteristics of deposited film were measured by FTIR, Micro-Raman Spectrometer, UV/Visible spectrometers. The results showed absorptance of the film were reached 40~50% at wavelength of 400nm. The photo energy gap were varied from 1.7~2.0eV depending on the structure of films. The silicon films deposited by ion beam sputter revealed amorphous characters .When the substrate temperature was set at 350℃and hydrogen gas flow was set as 10sccm would favor the formation Si-H2 bond. The analyses of the electrical property show that the dark and photo induced current decreased with increased substrate temperature and hydrogen gas flows.
author2 Wen-Tuan Wu
author_facet Wen-Tuan Wu
Jin-Cheng Tsai
蔡進成
author Jin-Cheng Tsai
蔡進成
spellingShingle Jin-Cheng Tsai
蔡進成
Study of Amorphous Silicon Film Using Ion Beam Sputtering
author_sort Jin-Cheng Tsai
title Study of Amorphous Silicon Film Using Ion Beam Sputtering
title_short Study of Amorphous Silicon Film Using Ion Beam Sputtering
title_full Study of Amorphous Silicon Film Using Ion Beam Sputtering
title_fullStr Study of Amorphous Silicon Film Using Ion Beam Sputtering
title_full_unstemmed Study of Amorphous Silicon Film Using Ion Beam Sputtering
title_sort study of amorphous silicon film using ion beam sputtering
publishDate 2010
url http://ndltd.ncl.edu.tw/handle/58589176068318499965
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