The study on applying RFID to the MES for wafer testing industry.

碩士 === 南台科技大學 === 資訊管理系 === 98 === For the semiconductor wafer testing industry, the manufacturing process and category of product are more complex, and the timely and correct information must be provided to the customers, a single management system is already not able to fully control. Therefore, a...

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Bibliographic Details
Main Authors: Yen-Ching Fang, 方燕卿
Other Authors: Yi-Hsing Chang
Format: Others
Published: 2010
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