APA (7th ed.) Citation

Fang, Y., 方燕卿, & Chang, Y. (2010). The study on applying RFID to the MES for wafer testing industry.

Chicago Style (17th ed.) Citation

Fang, Yen-Ching, 方燕卿, and Yi-Hsing Chang. The Study on Applying RFID to the MES for Wafer Testing Industry. 2010.

MLA (8th ed.) Citation

Fang, Yen-Ching, et al. The Study on Applying RFID to the MES for Wafer Testing Industry. 2010.

Warning: These citations may not always be 100% accurate.