Fang, Y., 方燕卿, & Chang, Y. (2010). The study on applying RFID to the MES for wafer testing industry.
Chicago Style (17th ed.) CitationFang, Yen-Ching, 方燕卿, and Yi-Hsing Chang. The Study on Applying RFID to the MES for Wafer Testing Industry. 2010.
MLA (8th ed.) CitationFang, Yen-Ching, et al. The Study on Applying RFID to the MES for Wafer Testing Industry. 2010.
Warning: These citations may not always be 100% accurate.