The study on applying RFID to the MES for wafer testing industry.

• Main Authors: Yen-Ching Fang, 方燕卿
• Other Authors: Yi-Hsing Chang
• Format: Others
• Language: zh-TW
• Published: 2010
• Online Access: http://ndltd.ncl.edu.tw/handle/68967512503316141650

碩士 === 南台科技大學 === 資訊管理系 === 98 === For the semiconductor wafer testing industry, the manufacturing process and category of product are more complex, and the timely and correct information must be provided to the customers, a single management system is already not able to fully control. Therefore, a well-designed management system such as MES can provide the proper information, save the company manpower and enhance the throughput of products. In this thesis, RFID technology is combined with existing MES to progress the track of whole process for the products (Work-In-Process, WIP) in wafer testing. The on-site manufacturing information and the present situation of production process are then timely and correct reported to the MES administrator. To assess the effect of combining RFID into MES, we actually take A-Company as the experimental object. After the experiment, the average capacities of cutting group, grinding group and test group are improved 25.7%, 21.3% and 36.1% respectively. In addition, the entire benefits for the quality control in manufacturing, the efficiency of production scheduling and the management of working-hour are all evident promotion. Through the research, we hope that the enterprises can reduce the defect rate of product and the production costs, shorten the manufacturing cycle, and the response ability to market. Finally, the enterprises enhance the competitiveness in the semiconductor wafer industry.