Simulation of NSCR ESD Protection Device for BCD 40V Technology
碩士 === 亞洲大學 === 資訊工程學系碩士班 === 98 === Reliabilities of semiconductor devices become more concerned issues in modern semiconductor integrated circuits. One of failure problems is electro-statics discharge (ESD) failures that caused by triboelectric charging, so to encounter this problem by using ESD p...
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| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/95955380213629387239 |