A Filling Methodology for Efficient Compaction of Test Responses with Unknowns.
碩士 === 淡江大學 === 電機工程學系碩士在職專班 === 98 === Reducing test application time and test data volume are major cost factor in SoC design. Currently, scan-based testing is widely adopted on SoC test, a large number of scan cells coupled with a large number of scan patterns have inflated test data volume and t...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/64068298656398651689 |