Test Data Compression using 2n Pattern Run-length codes

碩士 === 元智大學 === 資訊工程學系 === 98 === This paper presents a pattern run-length compression method. Compression is conducted by encoding 2|n| runs of compatible or inversely compatible patterns into codewords in the view either inside a single segment or across multiple segments. With the provision of hi...

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Bibliographic Details
Main Authors: Cheng-Ho Chang, 張正和
Other Authors: Wang-Dauh Tseng
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/75904439323760092830