Simulation of Substrate Crack Propagation in a Thin Film/Substrate System Subjected to Uniform Stress

碩士 === 元智大學 === 機械工程學系 === 98 === The extended finite element method (XFEM) is able to analyze the problems, for example, discontinuities and singularities that standard FEM cannot efficiently solve. XFEM allows modeling a crack without explicitly defining the crack surface and needs no remeshing wh...

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Bibliographic Details
Main Authors: Pey-Chiann Tsai, 蔡佩蒨
Other Authors: N. Yu
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/12420041091909391124