Characterization and Reliability of nMOSFETs on Flexible Substrates under Mechanical Strain

碩士 === 長庚大學 === 電子工程學系 === 99 === With continued technology scaling, emerging three-dimensional (3D) integration technologies and System-in-Package (SiP) are the better solutions for miniaturization of systemized semiconductor devices than System-on-Chip(SoC). The 3D stacking is the predominant for...

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Bibliographic Details
Main Authors: Meng Ting Chen, 陳孟廷
Other Authors: H. L. Kao
Format: Others
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/55522608195516332664