Principle of probes and its measurement results for silicon wafers
碩士 === 中原大學 === 電機工程研究所 === 99 === Abstract The discussion topics of this report as below : 1. Growing and testing introduction of wafer: I will introduce concepts of growing, assembling,and testing in this chapter. 2. Introduction of testing tester and environment :Specifications, characteristic,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/yzmf62 |