Integrating ICA and SVM for identifying mixture control chart patterns in a multivariate process
碩士 === 輔仁大學 === 應用統計學研究所 === 99 === Mixture control chart patterns (CCPs) mixed by more types of basic CCPs together usually exist in the real manufacture process. However, most existing studies are considered to recognize the single abnormal CCPs. This study utilizes independent component analysis...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26147923777968786684 |