Measurement of photocurrent variations of optoelectronic devices under a localized illumination by using a scanning near-field microscope
碩士 === 國立中興大學 === 物理學系所 === 99 === We studied the optical and structure properties of blue light-emitting diodes(LED) by using Scanning Near-Field Microscope. The samples are InGaN-based LED on a planer substrate and on a patterned substrate. The Electroluminescence(EL) distribution mappings were co...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/f7hdn3 |