Investigation on the structural properties of CuInxGa1-xSe2 films using transmission electron microscopy
碩士 === 中興大學 === 物理學系所 === 99 === In this thesis , transmission electron microscopy (TEM) along with x-ray diffraction (XRD) were conducted to evaluate the structural characteristics of copper indium gallium di-selenide (CuInxGa1-xSe2；CIGS) films. The CIGS films were prepared by selenization of spu...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37677221269678063179 |