Study on the Degradation Phenomena of N-type Low Temperature Poly-Si Thin Film Transistors under DC and AC Stress in Off Region
碩士 === 國立中興大學 === 電機工程學系所 === 99 === Because the mobility of LTPS (low temperature polycrystalline silicon) TFTs (thin film transistors) is larger than that of amorphous silicon TFTs, LTPS TFTs have widely used in the new generation display. Therefore, to investigate the reliability of LTPS...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/96023894838278074257 |