Development of an Instantaneous Phase Shifting Electronic Speckle Pattern Interferometry System
碩士 === 國立成功大學 === 機械工程學系碩博士班 === 99 === In the past, when the Electronics Speckle Pattern Interferometry uses phase shift method to measure test specimen, stepping motor or piezoelectric transducers are normally used to move reference surface or test specimen or rotate the polarizer to get different...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2010
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| Online Access: | http://ndltd.ncl.edu.tw/handle/13694715801856774716 |