Compact Model Parameter Extractions for MOS and TFT Devices

碩士 === 國立交通大學 === 電信工程研究所 === 99 === A set of semiconductor device model and parameters bridges the communities between circuit design and chip fabrication. With the aggressive down-scaling technologies, the surface-potential-based PSP model has been regarded as the advanced one and has been selecte...

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Bibliographic Details
Main Authors: Tseng, Yu-Hsiang, 曾毓翔
Other Authors: Li, Yiming
Format: Others
Language:en_US
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/49288409339086360723