On-line Prediction Model for Wafer Test Recover Yield
碩士 === 國立交通大學 === 理學院應用科技學程 === 99 === On-line re-probing function of failed dies is used to increase the 1st yield in order to reduce the probability of wafer re-loading for off-line re-testing. It will perform re-testing before wafers are unloaded from the prober when the result of the 1st yield...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56970331768298743025 |