Fabrication and Electrical Characterization of Tripled Coupled Ge-QD Tunneling Diode

碩士 === 國立中央大學 === 電機工程研究所 === 99 === In this thesis, we are able to form triple coupled Ge-QD tunneling diodes with controlled thickness (10 nm-18 nm) of tunneling barrier by way of forming spacer layers on patterned grating structure without complicated, advanced lithography and etching. Closely co...

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Bibliographic Details
Main Authors: Ya-han Liang, 梁雅涵
Other Authors: Pei-wen Li
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/45322698759983582659