Microwave measurement for silicon-based quantum-dot devices

碩士 === 國立彰化師範大學 === 光電科技研究所 === 99 === We have fabricated the coupled quantum-dots and the quantum-dot single electron transistors (SET) on SOI wafer by using Electron beam lithography and pattern-dependent oxidation technique. In the first part, the dc transport properties of coupled quantum dots h...

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Bibliographic Details
Main Authors: Yu-Cheng Chang, 張佑誠
Other Authors: Cen-Shawn Wu
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/36808033926384250650