Simulation of Ion Implantation Optimization for the 80-nm Metal-Oxide-Semiconductor Field-Effect Transistor and Preliminary Study of Monte Carlo Ion Implant Simulation

碩士 === 國立東華大學 === 電機工程學系 === 99 === In this paper we use the commercial semiconductor process and device simulator, Sentaurus, to simulate for one-dimensional ion implant characteristic, the two-dimensional ion implantation 80-nm metal-oxide-semiconductor field-effect transistor (MOSFET) and the...

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Bibliographic Details
Main Authors: Sheng-Fu Hsu, 許勝富
Other Authors: Keng-Ming Liu
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/70718075250348370912