Dynamic Investigation of Entrance Exam Stress for Junior High School Students

碩士 === 南華大學 === 企業管理系管理科學碩博士班 === 99 ===   The stress of the entrance exam leads to the bias of educational development. The class adopts ability-grouped to increase the admitted proportion causes not only the students feel suffering in high-leveled class from serious pressure but the others in low-...

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Bibliographic Details
Main Authors: Hu-hsin Hsu, 許護馨
Other Authors: Chun-hsiung Lan
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/99312457151164344406