Reengineering and Evaluation of TFT-LCD Product Design Verification Process: The Overlapping Approach

碩士 === 國立清華大學 === 工業工程與工程管理學系 === 99 === Short product development lead time is one of the most important competitive advantages in TFT-LCD industry. Design Verification Testing (DVT) process accounts for much of this lead time. In this research, we propose a new DVT process by overlapping some of...

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Bibliographic Details
Main Author: 吳麗蘋
Other Authors: 蘇哲平
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/44231709761161959463