Study on Electrode Materials and Switching Characteristics of HfO2 Bipolar Resistive Memory

碩士 === 國立清華大學 === 電子工程研究所 === 99 === In this thesis, we discuss on the top electrode effect, current conduction mechanism and annealing effect for the HfO2 based RRAM. At the discussion of the top electrode effect, the W top electrode causes the device to present unipolar operation, but in the W/Ti...

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Bibliographic Details
Main Authors: Tsai, Ken-Hsiao, 蔡侃學
Other Authors: Lien, Chenhsin
Format: Others
Language:zh-TW
Published: 2010
Online Access:http://ndltd.ncl.edu.tw/handle/25086875614433159578