可修補的三維晶片設計與修補方法

博士 === 國立清華大學 === 電機工程學系 === 99 === In view of the challenges encountered by CMOS scaling, it seems inevitable that a highly integrated system on chip (SOC) must start from low production yield, and then it takes tremendous time and effort to improve the yield to a reasonably high level. Three-dimen...

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Bibliographic Details
Main Authors: Chou, Yung-Fa, 周永發
Other Authors: Wu, Cheng-Wen
Format: Others
Language:en_US
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/10213278359772366387