Measurements of Single-Molecule Conductance by Conductive Atomic Force Microscopy with Tactile Feedback: the Effect of the Cantilever Force Constant
碩士 === 國立臺灣大學 === 化學研究所 === 99 === Abstract In the field of molecular electronics, c-AFM BJ (conductive atomic force microscopy break junction) is one of the methods employed to create molecular junctions of metal–molecule–metal configurations through which single-molecule conductance can be measure...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/38430640100520236824 |