Applying Automatic Optical Detection Technique to the Micro Defects Identification System for LED
碩士 === 國立臺灣科技大學 === 自動化及控制研究所 === 99 === This study identified and classified micro defects in LED grain. The LED grain inspection was divided into three parts in this study, which are inspection of LED grain shape, inspection of electrode zone of LED grain and inspection of luminous zone of LED gra...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/3bztw9 |