A Study on the Resistivity and Gap Filling Capability from Tungsten Chemical Vapor Deposition Film

碩士 === 國立臺北科技大學 === 化學工程研究所 === 99 === This paper studied two major topics. The first part discuss resistivity cause of tungsten chemical vapor deposition plug for semiconductor; the other is that can be employed the method of equipment parameter to retard or inhibit higher resistivity. The follow...

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Bibliographic Details
Main Authors: Che-Hsien Liao, 廖哲賢
Other Authors: Wen-Jeng Guo
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/272xp4