Design and Implementation of a Universal Probe Sensitivity Controller for Atomic Force Microscopes

碩士 === 東南科技大學 === 電機工程研究所 === 99 === The main purpose of this thesis is to design and implement a universal probe sensitivity controller for atomic force microscopes (AFM), which allows the AFMs to be applicable in air and liquid as well as in vacuum. To achieve this purpose, the electro-mechanical...

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Bibliographic Details
Main Authors: Sie, Shang-hong, 謝尚宏
Other Authors: Wang, Yuan-Jay
Format: Others
Language:zh-TW
Published: 2011
Online Access:http://ndltd.ncl.edu.tw/handle/15041927350047678584