Reduction Run Length Variability for One-Sided CCC Chart
碩士 === 國立雲林科技大學 === 工業工程與管理研究所碩士班 === 99 === In statistical process control, p-chart is usually for monitoring the fraction nonconforming. The control limits of p-chart are obtained based on Normality assumption. Normality assumption will be violated for very low fraction nonconforming in high yield...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/66777328369199428927 |