Reduction Run Length Variability for One-Sided CCC Chart

• Main Authors: Kuo-min Lo, 羅國閔
• Other Authors: none
• Format: Others
• Language: zh-TW
• Published: 2011
• Online Access: http://ndltd.ncl.edu.tw/handle/66777328369199428927

碩士 === 國立雲林科技大學 === 工業工程與管理研究所碩士班 === 99 === In statistical process control, p-chart is usually for monitoring the fraction nonconforming. The control limits of p-chart are obtained based on Normality assumption. Normality assumption will be violated for very low fraction nonconforming in high yield process. The cumulative counts of conforming chart (CCC chart) is proposed for monitoring high yield process. In this study, one-sided CCC chart and one-sided CCC-r chart are proposed to detect upward or downward changes in high yield process. The run length average and variability are also investigated. The experimental results demonstrate one-sided CCC chart or one-sided CCC-r chart have good performance when the fraction nonconforming raises.