Machine vision-based defect detection of solar cells/modulesin electroluminescence images
碩士 === 元智大學 === 工業工程與管理學系 === 99 === Finger interrupt, micro-crack and breakage are severer defects in the multicrystalline solar cell and cannot be observed by the naked eyes or the conventional CCD camera. The Electroluminescence (EL) imaging technique can be used instead to highlight these de...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/24265075299846710310 |