Low Capture Power ATPG
碩士 === 元智大學 === 資訊工程學系 === 99 === With the advancement for today’s very large scale integration (VLSI) circuits, power dissipation is becoming a critical issue during design-for-test and test prepara-tion for low-power devices. In scan-based designs, the circuit states in test mode may do not exist...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/16697514879266198521 |