Research on Power Integrity of Multi-Layer Ceramic Substrate
碩士 === 中華大學 === 電機工程學系碩士在職專班 === 100 === The process of testing the Wafer with the Probe Card sometimes may cause the Wafer’s power supply to become unstable. When problems occur, the Probe Card manufacturer or the customer will waste time and money. In the integrated circuit design stage, one can...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/33615062444361677220 |