The Structure and Optical Properties of AlN Thin Film by DC reactive Magnetron Sputtering System

碩士 === 中原大學 === 電子工程研究所 === 100 === In this thesis, AlN thin film was grown on sapphire using DC magnetron sputtering system. The AlN thin film exhibits c axis preferred orientation, and low R.M.S roughness. The dependence of film quality on growth parameters, such as total sputtering pressure, subs...

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Bibliographic Details
Main Authors: Tzu-Yi Chuang, 莊子毅
Other Authors: Jyh-shin Chen
Format: Others
Language:zh-TW
Published: 2012
Online Access:http://ndltd.ncl.edu.tw/handle/53233460986284203479