Pattern Recognition Method for the Defects in TFT-LCD Array
碩士 === 逢甲大學 === 資訊電機工程碩士在職專班 === 100 === This study applied an automatic optical inspection (AOI) method to improve the quality of manufacturing processes for TFL-LCD (thin-film transistor liquid-crystal display) panels, which could prevent low yield due to inattention failures, man-made errors and...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/dr3p6z |