Correlation and Analysis of Measurement Methods for Electromagnetic Emission from Integrated Circuits
碩士 === 逢甲大學 === 通訊工程所 === 100 === In recent years, due to the rapid development of process technology, the operation frequency and functions of Integrated Circuit is increasing so that cause the problem of Signal Integrity and Electromagnetic Compatibility. Future, ICs will be more minify and have...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/7tk2as |