Integrating the RFID, SCM and ERP Systems for the Critical Success Factors optimization in Semiconductor testing factory.
碩士 === 開南大學 === 國際企業學系 === 100 === Nowadays semiconductor-testing plants have imported the Supply Chain Management system, and few of them combine wireless Radio Frequency Identification technology and ERP. Therefore, with the trend and the rapid changes of semiconductor technology, adopting RFID te...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/49966506153983848408 |