Design and Design for Testability of Operational Amplifier
碩士 === 國立高雄應用科技大學 === 電子工程系 === 100 === In this thesis, we firstly design a two-stage operational amplifier (op amp) and then propose a design for testability (DFT) for integrated op amp. In the testing mode, The op amp device under test (DUT) is connected as a buffer circuit and a pulse signal is a...
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| Format: | Others |
| Language: | zh-TW |
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54058009438771507181 |