Improvement of test yield for IC product
碩士 === 明新科技大學 === 電機工程研究所碩士在職專班 === 100 === Abstract Semiconductor testing plant usually increases tester utilization and reduces overkill to increase profits and decrease the cost of replacement parts. Traditionally, IC product test is conducted through the socket pogo pin contact with IC pin or s...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2011
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/10278273900914863189 |