A study of statistical method on estimating rare event in IC Current
碩士 === 國立政治大學 === 統計研究所 === 100 === To obtain the tail distribution of current beyond 4 to 6 sigma is nowadays a key issue in integrated circuit (IC) design and computer simulation is a popular tool to estimate the tail values. Since creating rare events via simulation is time-consuming, often the l...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/58070911651492279886 |