Using Enhanced Adaptive Grey Model for solving the Pilot Run Forecasting Problem in Copper Pillar Assembly Process
碩士 === 國立成功大學 === 工業與資訊管理學系碩博士班 === 100 === In new product build up, SPC data that gather by insufficient prior run samples is not complete enough to offer production performance for engineering’s study and evaluation,especially for semi-conductor technology progress. As multiple and thin function c...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/83336346225522181127 |