Investigation of Phase Transformation of Silicon AFM Probes during Scanning
碩士 === 國立成功大學 === 材料科學及工程學系碩博士班 === 100 === Wear of probe tips is an inevitable and very serious issue during the use of atomic force microscope (AFM). Wear can introduce artifacts and reduce the image resolution. The force which effects on the probe tips’ surface vertically is too great so that...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/20808575731607393615 |