Lower confidence bound for two sided process capability index Spk
碩士 === 國立交通大學 === 工業工程與管理學系 === 100 === Process yield has been a common and standard criterion in manufacturing industry for a long time. The yield index provides an exact measure on the production yield of normal processes. However, the sampling distribution of estimated is analytically intract...
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| Format: | Others |
| Language: | en_US |
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2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26981662476167925759 |