Lower confidence bound for two sided process capability index Spk
碩士 === 國立交通大學 === 工業工程與管理學系 === 100 === Process yield has been a common and standard criterion in manufacturing industry for a long time. The yield index provides an exact measure on the production yield of normal processes. However, the sampling distribution of estimated is analytically intract...
Main Author: | 楊榮欽 |
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Other Authors: | 彭文理 |
Format: | Others |
Language: | en_US |
Published: |
2012
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Online Access: | http://ndltd.ncl.edu.tw/handle/26981662476167925759 |
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