On-Chip Transient Detection Circuit with SCR as Memory Unit for System-Level ESD Protection
碩士 === 國立交通大學 === 電子研究所 === 100 === Electrostatic discharge (ESD) is the main reason that causes electrical overstress (EOS) on microelectronic products. Recently, as technology scaling down to the deep sub-micron, more integrated circuits are integrated into single chip to decrease the cost of micr...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26609347810059097996 |