Robustness of Nano-Scale SRAM Design: Reliability and Tolerance Techniques
博士 === 國立交通大學 === 電子研究所 === 100 === This thesis discusses the reliability and tolerance techniques for the robust nanoscale SRAM design. It provides comprehensive analyses on the impacts of Bias Temperature Instability (BTI) and gate-oxide breakdown on power-gated SRAMs, including the stability and...
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/03899148500620045179 |