Design and Implementation of Dynamic Word Line Pulse Write Margin Measurement with Build-in Pulse Width Measurement Circuits
碩士 === 國立交通大學 === 電子研究所 === 100 === In the SRAM design, 6T structure has higher density and speed and have been the mainstream of SRAM for the past two decade. But as the process scaling down to nanometer, the process variation makes the readability and writ ability of 6T SRAM get degraded, or even...
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67149556308208754848 |