A Theoretic Study on Three Low-Density Parity-Check and BCH Concatenated Coding Schemes
碩士 === 國立交通大學 === 電信工程研究所 === 100 === Bose-Chaudhuri-Hocquenghem (BCH) codes have been widely used in flash memories for many years. Yet, in future “high-density” multi-level cell (MLC) flash memories, the raw bit-error-rate (BER) in NAND flash may increase up to around 10−2 at its life time, and...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37821241941837457230 |