Applying Edge Detection and Binary Image Histogram to Chip Defect Inspection
碩士 === 國立交通大學 === 電控工程研究所 === 100 === Defect occurs for a few of chips during manufacture. If defect size is greater than the criterion of impacting chip quality, these unqualified chips have to be removed. Automatic chip defect inspection is desirable, since chip on defect is now still inspected...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2011
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| Online Access: | http://ndltd.ncl.edu.tw/handle/35428346898560106197 |