The Reliability Analysis of Step-Stress Accelerated Life Tests Under Generalized Gamma Lifetime Distributions With Type-II Censoring
碩士 === 國立中央大學 === 統計研究所 === 100 === High reliability products through strictly controlled in the manufacturing process, so their lifetimes are longer under normal environment. Accelerated life test is often useful to observe enough lifetime information of the products. In this thesis, we discuss the...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2012
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| Online Access: | http://ndltd.ncl.edu.tw/handle/02860347123830041823 |